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August 22, 2025Plant MethodsOpen Access

Lightweight deep neural network for contour detection and extraction of wheat spikes in complex field environments

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Authors

XXXin XuHZHaiyang ZhangJLJianyun Lu

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Overview

Enhanced YOLOv9-LDS framework improves contour extraction accuracy in complex wheat field environments, indicating better yield estimates.

Key Points

  • The improved model achieved an 83.9% contour integrity recognition rate, enhancing segmentation accuracy in wheat fields.
  • With multi-scale feature synergy, the approach overcomes traditional model limitations, improving detection of overlapping spikes.
  • Ablation studies show the LDSNet-ELA integration reduces false positives by 27.6%, improving overall model reliability in field conditions.
  • This framework advances intelligent spikelet counting systems for wheat, demonstrating significant implications for crop phenomics.

Cite This Study

Xu et al. (2025) studied this question.

synapsesocial.com/papers/68af59d2ad7bf08b1eade171https://doi.org/10.1186/s13007-025-01433-1
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