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September 5, 2025Deleted Journal

Structural and Optical Properties of Nickel Oxide Thin Films Deposited by Sol-Gel Dip-Coating Technique

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Nickel oxide thin films exhibit a cubic polycrystalline structure with predominant crystallization direction (111), indicating solid material formation.
X-ray diffraction results confirm the crystallite size of nickel oxide films at 100°C is 23.97 nm, highlighting structural integrity.
Optical testing shows light transmittance exceeds 90% in visible and near-infrared regions, suggesting potential applications for these thin films.
Absorbance decreases with increasing wavelength, indicating a semiconductor with a wide optical energy gap measured at 3.61 eV.

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Research reveals nickel oxide thin films' optical and structural properties, indicating semiconductor behavior.

Khamis et al. (2025) studied this question.

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