Direct Total Reflection X‐Ray Fluorescence Analysis of Thin Broccoli Sections Prepared Using Microtome

This study presents an alternative sample preparation method for total reflection X‐ray fluorescence (TXRF) analysis using a microtome to simplify the analysis of trace elements in vegetables. The present study demonstrates a direct sectioning approach in which fresh vegetable samples were cut into thin slices using a microtome without any preprocessing, highlighting a key difference and practical advantage of this method. Traditional methods such as inductively coupled plasma mass spectrometry (ICP‐MS) require complex preprocessing and sample destruction, limiting cross‐method comparisons. In contrast, TXRF analysis enables the preservation of samples while facilitating the direct examination of trace elements. We employed a medical sliding microtome to prepare ultra‐thin broccoli sections, achieving thicknesses under the recommended 15 mm for optimal TXRF analysis. Sections were treated with a vanadium internal standard solution to ensure reliable quantification. Elemental distribution images were obtained using a micro‐XRF analyzer, confirming the suitability of the internal standard method. Quantitative comparisons between TXRF and ICP‐MS analyses demonstrated consistent results, although variations were observed owing to localized elemental concentrations. This microtome‐based approach significantly reduces the preparation time and enhances resource efficiency, making it applicable for evaluating phytoremediation techniques in environmental science.