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High-energy diffuse X-ray scattering at ultra-small-angle grazing incidence for local structure study of single-crystalline thin films

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Novel method investigates local atomic structures in single-crystalline thin films, suggesting enhanced resolution and surface sensitivity.

This approach enables detailed insights into atomic structures, capturing spatial correlations within unit cells.
The high-energy X-ray scattering method improves surface sensitivity, providing high-resolution analysis of structures.
Employing three-dimensional pair distribution function analysis allows for quantitative interpretation of local structures.
The model systems studied include ferroelectric PbTiO3 and dielectric SrTiO3 superlattices to showcase effectiveness.

Bang et al. (2025) studied this question.

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Novel method investigates local atomic structures in single-crystalline thin films, suggesting enhanced resolution and surface sensitivity.