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Assessment of Spot Blotch Resistance and Yield Traits in Wheat Genotypes in a Subtropical Agro-Ecology of Nepal

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Field assessment reveals genetic variability in wheat genotypes against spot blotch, suggesting potential for yield improvement.

Grain yield negatively correlated with AUDPC, indicating disease severity impacts yield performance significantly.
Genotype YMI#6 demonstrated the lowest AUDPC, while RR 21 showed the highest, highlighting variability in disease resistance.
Analysis revealed significant differences in thousand kernel weight and spike characteristics among resistant and susceptible genotypes.
Correlation between AUDPC and days to maturity suggests that disease presence accelerates developmental stages in affected plants.

Neupane et al. (2025) studied this question.

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