Dynamic memory swapping improves detection of transient execution bugs in processors, suggesting enhanced hardware fuzzing techniques.
Transient execution vulnerabilities have emerged as a critical threat to modern processors. Hardware fuzzing testing techniques have recently shown promising results in discovering transient execution bugs in large-scale out-of-order processor designs. However, their poor microarchitectural controllability and observability prevent them from effectively and efficiently detecting transient execution vulnerabilities.
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Xu et al. (2025) studied this question.