Extending SiPM dynamic range with non-linear response correction: the single-step method

Silicon Photomultipliers (SiPMs) exhibit a non-linear response when exposed to high light levels due both to the finite number of available pixels (cells) and to their operation in Geiger mode, which together limit their effective dynamic range. In previous study, we introduced a measurement setup to assess the SiPMs' non-linear response that does not depend on a linear reference light source, thereby simplifying the calibration process. The so-called “single-step” method involves recording the detector's response to a base pulse with varying intensity alongside a small, constant additional pulse; the resulting correction function is derived from the difference between these two measurement sets. It was shown that this method allows for restoring the SiPM's response linearity within ± 5 %, even at light intensities approaching the number of pixels in the device. This contribution will present and discuss the systematic studies conducted, where the response of a SiPM operated at different temperatures and overvoltages are measured and corrected using this method. The results indicate that the correction can be reliably applied for overvoltage deviations of up to ± 2 V and temperature shifts within ± 40 K from the calibration condition.