This study demonstrates how optical spectroscopy reveals electronic and structural properties in perovskite thin films, suggesting potential applications in advanced devices.
Perovskite oxide thin films exhibit exceptional structural and electronic tunability, making them prime candidates for next-generation electronic, optoelectronic, and energy devices. This study investigates the use of optical spectroscopy techniques, such as UV-Visible, Raman, photoluminescence (PL), and X-ray absorption spectroscopy (XAS), to probe the electronic structure and lattice dynamics of perovskite oxide thin films. By analyzing the spectroscopic signatures of these materials, we elucidate their band structure, defect states, and phonon interactions. Experimental data collected from NiO (Co,Fe) thin films reveal significant variations in bandgap, photoluminescence, and Raman activity. The results demonstrate that optical spectroscopy not only provides non-destructive, high-resolution data but also enables real-time monitoring of film quality and functional properties. Our findings support the critical role of optical spectroscopy in advancing the understanding and engineering of perovskite oxides for technological applications.
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Rani et al. (2024) studied this question.
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