This analysis finds new ways to cluster partial discharge pulses in DC systems, suggesting enhanced accuracy in diagnostics using wavelet decomposition and principal component analysis.
Partial discharge (PD) is a critical indicator of insulation degradation in high-voltage DC systems, necessitating accurate diagnosis to ensure long-term reliability. Conventional AC-based diagnostic methods, such as phase-resolved partial discharge analysis (PRPDA), are ineffective under DC conditions, emphasizing the need for waveform-based analysis. This study presents a novel clustering framework for DC PD pulses, leveraging multi-level wavelet decomposition and statistical feature extraction. Each signal is decomposed into multiple frequency bands, and 70 distinctive waveform features are extracted from each pulse. To mitigate feature redundancy and enhance clustering performance, principal component analysis (PCA) is employed for dimensionality reduction. Experimental data were obtained from multiple defect types and measurement distances using a 22.9 kV cross-linked polyethylene (XLPE) cable system. The proposed method significantly outperformed conventional time-frequency (T-F) mapping techniques, particularly in scenarios involving signal attenuation and mixed noise. Propagation-induced distortion was effectively addressed through multi-resolution analysis. In addition, field noise sources such as HVDC converter switching transients and fluorescent lamp emissions were included to assess robustness. The results confirmed the framework’s capability to distinguish between multiple PD types and noise sources, even in challenging environments. Furthermore, optimal mother wavelet selection and correlation-based feature analysis contributed to improved clustering resolution. This framework supports robust PD classification in practical HVDC diagnostics. The framework can contribute to the development of real-time autonomous monitoring systems for HVDC infrastructure. Future research will explore incorporating temporal deep learning architectures for automated PD-type recognition based on clustered data.
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Yoon et al. (2025) studied this question.
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