Spectrum-feature control of diffuse reflectance for NIR-SWIR absorbing dyes based on surface topology

This study presents analyses that examine spectrum-feature control of diffuse reflectance for NIR-SWIR absorbing dyes, as function of dye-combination surface topology on substrates. These analyses are in terms of dyed-sample characterization in the laboratory and parametric modeling. Spectrum-feature control, as function of surface topology, is modeled parametrically by linear combinations of segmented reflectance contributions to the reflectance function, which is according to diffuse-reflectance theory. The segmented reflectance contributions are distributed upon substrate surfaces according to different topologies. Spectrum-feature dependence of diffuse-reflectance spectra for NIR-SWIR absorbing dyes on substrates is examined for specific topologies concerning composite-material layers on paper substrates. Understanding the topological dependence of diffuse reflectance can assist in determining optimal composite-material configurations for specific reflectance specifications.