Analysis And Optimization Of Multilayer Silicon Structures Via Ellipsometry For Solar Cell Efficiency

This study presents a comprehensive analysis of multilayer silicon-based structures using spectroscopic ellipsometry to enhance the performance of solar cells. By measuring ellipsometric parameters (Ψ and Δ) across a wide spectral range and applying effective medium approximations, the optical properties of monocrystalline (c-Si), polycrystalline (pc-Si), and amorphous silicon (a-Si) layers are thoroughly investigated. The research incorporates numerical modeling, structural reconstruction, and cross-sectional transmission electron microscopy (XTEM) to validate layer thickness, composition, and surface morphology. The results highlight the impact of grain boundaries, surface roughness, and void fractions on light absorption and penetration depth, particularly in the short-wavelength region. The proposed methodology enables accurate characterization and optimization of thin-film structures, contributing to improved solar energy conversion efficiency.