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This analysis explores mbist's role in detecting memory faults in soc, indicating its importance in design-for-testability.
In today's VLSI SoC designs, embedded memories dominate die area and often limit manufacturing yield. Design-for-Testability (DFT) is crucial for detecting manufacturing defects early and ensuring robust design validation. Among DFT techniques, Memory Built-In Self-Test (MBIST) plays a pivotal role by embedding test and repair logic within memory subsystems. MBIST facilitates detection of memory faults such as stuck-at, transition, coupling, and retention faults, using March algorithms and fault models.
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Sandeep Santosh (2025) studied this question.
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