Unveiling Nanoscale Ordering in Amorphous Semiconducting Polymers Using Four-Dimensional Scanning Transmission Electron Microscopy

We present four-dimensional (4D) scanning transmission electron microscopy (STEM) analysis to obtain a high level of detail regarding the nanoscale ordering within largely disordered organic semiconducting polymers. Understanding nanoscale molecular ordering in semiconducting polymers is crucial due to its connection to the materials' important properties. However, acquiring such information in a spatially localized manner has been limited by the lack of a nanoscale experimental probe, weak signal from ordering, and radiation damage to the sample. By collecting nanodiffraction patterns with a high dynamic range pixelated detector, we acquired statistically robust, high signal-to-noise ratio diffraction patterns from semiconducting organic materials, including poly(3-hexylthiophene-2,5-diyl) (P3HT), P3HT/[6,6]-phenyl C61 butyric acid methyl ester, and indacenodithiophene-