Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
August 9, 2024Meeting abstracts/Meeting abstracts (Electrochemical Society. CD-ROM)

(Invited) Bulk Traps in Layered 2D Gate Dielectrics

View Full Paper
Ask AI
Bookmark
Share

Authors

JSJaemin ShinTPTyafur PathanGZGuanyu Zhou

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Shin et al. (2024) studied this question.

synapsesocial.com/papers/68e5ceb9b6db643587565450https://doi.org/10.1149/ma2024-01211291mtgabs
View Full Paper
Ask AI
Bookmark
Share