Feasibility of the matched‐field source localization within diffraction and multiple reflections

The problem of localizing the source of monochromatic radiation in two-dimensional space is considered. The space contains several arbitrary placed thin vertical knife-edges, which leads to diffraction and multiple reflection effects. Complex field amplitude measurements and environment parameters are considered as input data for the mathematical model. The problem is formulated using the method of conjugate equations. The two most commonly used varieties of the matched field processing method are analyzed: the Bartlett method and the minimum variance method. Numerical experiments were carried out for various locations of knife-edges and receivers. Stability with respect to the location of knife-edges is analyzed. It has been shown that the mentioned methods can be successfully used to localize radiation sources under conditions of multiple reflection and line of sight.