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July 22, 2024Applied Optics

Improving optical thickness monitoring by including systematic and process-influenced transmittance deviations: publisher’s note

Stefan Bruns Philipp Farr Thomas Melzig Jörg Terhürne Michael Vergöhl

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Abstract

This publisher’s note reports corrections in Appl. Opt. 62 , B141 ( 2023 ) APOPAI 0003-6935 10.1364/AO.475076 .

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Cite This Study

Bruns et al. (2024) studied this question.

synapsesocial.com/papers/68e5f84db6db64358758c47a https://doi.org/10.1364/ao.537478

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