Short-term stability of a microcell optical reference based on Rb atom two-photon transition at 778 nm

We report on the development and short-term stability characterization of an optical frequency reference based on the spectroscopy of the rubidium two-photon transition at 778 nm in a microfabricated vapor cell. When compared against a 778 nm reference signal extracted from a frequency-doubled cavity-stabilized telecom laser, the short-term stability of the microcell frequency standard is 3.5 × 10⁻¹³ τ-1/2 until 200~s, in good agreement with a phase noise level of $+$ 43 dBrad²/Hz at 1~Hz offset frequency. The two main contributions to the short-term stability of the microcell reference are currently the photon shot noise and the intermodulation effect induced by the laser frequency noise. With still a relevant margin of progress, these results show the interest of this spectroscopic approach for the demonstration of high-stability miniaturized optical vapor cell clocks. Such clocks are poised to be highly beneficial for applications in navigation, communications, and metrology.