Characterization of X-ray beam for Half and Quarter Value Layers

Abstract Introduction: The aim of this work is to assess the penetrating ability of an X-ray beam through a specific material, in conditions of narrow-beam geometry. Materials and Methods: During the experiment, samples were switched with the X-ray tube turned off, and the primary intensity of the unshielded X-ray beam (fixed 2.5mm shielding) was measured. Parameters were kept constant throughout, and the electrometer was used to stabilize the readings. Subsequent measurements aimed to determine the Half-Value Layer (HVL) and Quarter-Value Layer (QVL) by interpolating various sample slices to achieve intensity values of I/2 and I/4, respectively. The data were used to plot and analyze HVL and QVL graphs, providing insights into the attenuation properties of the X-ray beam through different materials. Findings of the result: The primary findings indicated that the initial unshielded X-ray beam intensity, with parameters set to 37.5 kV and 40 mA, provided a stable baseline measurement. The results showed a consistent decrease in intensity with increased sample thickness, confirming the exponential attenuation of X-rays. The HVL was determined by identifying the sample thickness that reduced the initial intensity by half, and the QVL by the thickness reducing it to one-fourth. The experimental data closely followed theoretical predictions, with HVL and QVL values providing a quantitative measure of the material's attenuation properties. Top of Form Bottom of Form Conclusion: Graphical analysis of the results demonstrated clear linear relationships on a semi-logarithmic scale, validating the accuracy of the measurement process and the reliability of the electrometer readings. These findings contribute to a better understanding of X-ray attenuation in different materials, which is crucial for various applications in medical physics and radiography.