Research on the application of BIT technology in the test and launch control system of new generation launch vehicle

In response to the urgent need for high-density launches, rapid testing, and cost-effective operations in launch vehicle technology, heightened requirements have been placed on test and launch control system in terms of miniaturization, universality, standardization, testability, and maintainability. Test and launch control system based on LRM (Line Replaceable Modules) modules have emerged as a primary development direction for the new generation of launch vehicle systems. A critical issue to address is the application of BIT (Built-In Test) technology in LRM-based systems. This paper introduces the architecture of the LRM-based test and launch control system, followed by an in-depth analysis of the application of BIT technology in terms of design principles, foundational theories, and operational modes. We propose a Three-Level BIT approach for the test and launch control system, providing a detailed description of its implementation. Applied to a specific model of launch vehicle test and control system, our testing results demonstrate that this method significantly enhances the system's self-diagnostic capabilities. This research offers robust technical support for the development and operation of high-quality, efficient, and cost-effective next-generation launch vehicle test and launch control system, underscoring their significant value and wide-ranging potential applications in the field of aerospace.