We provide a novel method to extract the loss characteristic of the whispering gallery mode (WGM) microcavities using optical frequency domain reflectometry (OFDR). We demonstrate the modified OFDR system in this measurement and the Q-factor of the microcavity is obtained accurately from the backscattered signals. Compared with the transmitted measurement method, the OFDR result can clearly show the optical path of the resonance mode in the spatial domain, and there is no need to distinguish the resonance from the complex transmitted spectra. This method is also demonstrated to be suitable for measuring polarization-sensitive devices.
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Zhang et al. (2024) studied this question.
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