Optimized Gd2O2S:Pr Scintillation Films for X-ray Flat Panel Imaging: Balancing Enhanced Efficiency with Flexibility

Scintillation materials are pivotal in diverse applications, such as medical diagnostics and radiation detection. Traditional methods for producing solid scintillators typically require high crystallization temperatures and prolonged processing times, which lead to elevated costs. Additionally, their intrinsic structural rigidity limits the development of specialized structures and large-scale detectors. In this study, we synthesized a Gd2O2S:Pr phosphor using the hot water bath reduction method and enhanced its microstructural and luminescent properties by incorporating various fluxes. We then created a flexible organic–inorganic composite scintillation film composed of Gd2O2S:Pr phosphors and polydimethylsiloxane (PDMS). This Gd2O2S:Pr–PDMS composite scintillation film demonstrated remarkable flexibility and a significantly enhanced XEL integral intensity compared to the commercial Bi4Ge3O12 (BGO) scintillation crystal. Remarkably, X-ray imaging with the Gd2O2S:Pr composite scintillation film as a detector enabled clear visualization of the chip's internal structure. These findings underscore the significant potential of the prepared Gd2O2S:Pr–PDMS composite scintillation film for large-scale X-ray flat panel imaging applications.