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May 15, 2024Chinese Journal of AeronauticsOpen Access

Reliability modelling and assessment of CMOS image sensor under radiation environment

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ZTZhao TaoWCWenbin ChenXLXiaoyang Li

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Tao et al. (2024) studied this question.

synapsesocial.com/papers/68e69ff0b6db64358762358fhttps://doi.org/10.1016/j.cja.2024.05.008
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