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Experimental overview of linearity metrics using complex modulated signals

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The study successfully demonstrates the characterization of linearity metrics in transistors and RF power amplifiers.
Key performance indicators evaluated include noise power ratio and error vector magnitude under various modulation signals.
Measurements utilized a PNA-X and vector signal analyzer to analyze the GaN transistor operating at 29 GHz.
Findings support efficient NPR measurement using unequally spaced multi-tone signals, implying valuable insights for RF design.

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Experimental overview examines linearity metrics in transistors and RF power amplifiers, indicating measurement feasibility.

Santos et al. (2025) studied this question.

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