On the Design of a 20 Channel Pin Parametric Measurement System for Post-Fabrication Testing

A new era of consumer electronics has arrived as a result of significant advancements in Artificial Intelligence (Al) and Internet of Things (IoT) applications. In order to secure long-term and stable operations of a integrated circuit (IC), parametric measurements have been one of must-have test procedures for post-fabrication production testing. This paper presents a 20 channel pin parametric measurement system, capable of performing four-quadrature parametric measurements. The system was built using off-the-shelf hardware components. As a proof of concept, the proposed system was verified in Force Voltage (FV) mode with the aid of an external digital multimeter (DMM). Besides, a simplified linear regression (SLR) method was employed to calibrate the proposed system. Calibration results have shown that PMU FV errors undergo a reduction of more than 400 times while using the SLR-based calibration method.