A Dual-Polarized Quad-Ridged Waveguide Antenna for OTA Near-Field ATE Socket in 5G-FR2 Band

This paper presents a novel dual-polarized antenna design for over the air (OTA) testing of 5G antenna in package (AiP) modules in high volume manufacturing (HVM) using commercial automated test equipment (ATE). The requirements for such measurement antenna are first the wide bandwidth to cover all the frequency bands of the 5G-FR2 standard (24 to 53 GHz). Second, the antenna requires a very low profile to fit in the change kit of a commercial automated packaged integrated circuit handler for AiP devices production testing. In this paper the measurement antenna design is described. Its wideband performance has been verified with measurements of a manufactured prototype. Also, the developed antenna integration on a device under test (DUT) socket for near-field OTA HVM testing is presented.