Characterization of devices operating under large signal conditions at nonlinear regions requires specific measurement setups since the output power value, operation efficiency, power gain, and linearity are functions of the source impedance, input signal level, biasing values, and load impedance. Hence, measuring a device's parameters while varying the source or load impedance (called source-pull and load-pull , respectively) is essential to evaluate its nonlinear behaviors.
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Lee et al. (2024) studied this question.
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