Low-temperature photoluminescence measurement with a micromachined Joule-Thomson cooler

This study evaluates the effectiveness of micromachined Joule-Thomson (MJT) cooling for photoluminescence (PL) materials. Achieving low temperatures is crucial for enhancing PL performance in semiconductors. However, the commonly used liquid nitrogen (LN 2 ) cryostats require frequent refills, hindering their long-term operation. The MJT cooler offers a potential solution by enabling integration with devices and longer operating time. To validate its effectiveness, this study conducted low-temperature PL measurements using a nitrogen MJT cooler. A MAPbI 3 thin film was used as the characterization sample owing to its clear PL mechanism. The experiment successfully preserved its temperature-dependent PL property, with an observed orthorhombic phase-change phenomenon between 155-165 K. Furthermore, the system demonstrated short cool-down time (<1 h), minimal temperature impact from laser stimulus (<±0.1 K), sample storage stability, and low coolant consumption.