The study focuses on the systematic growth and characterization of material properties, as well as the low-temperature transport properties, of ultrashallow heavily strained quantum wells. A new characterization method, called Density of Stress Accumulation Points, has been introduced for assessing quantum well strain. An ultrashallow heavily constrained quantum well with a remarkable mobility of 3.382×{}105 cm²/Vs was successfully achieved. This achievement serves as the foundation for the development of fully electrically controlled and microwave cavity-coupled quantum dot materials.
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Zhang et al. (2024) studied this question.
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