Analyzing Single-event transient (SET) propagation is vital for digital circuit reliability, especially in space electronics. Our research investigates SET propagation behavior in Skywater's 130 nm technology, focusing on complex gates and their responses to fan-out load variations. We gain insights into SET propagation within the chain of homogeneous and heterogeneous logic paths, exploring phenomena like pulse broadening and quenching, thereby, providing valuable information on selecting the best candidates for SET mitigation.
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Aravind et al. (2024) studied this question.
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