Single-shot extended field-of-view imaging using pupil phase engineering

We demonstrate an extended FOV imaging concept which relies on exchanging the real and the Fourier spaces relative to the structured illumination microscopy (SIM). While SIM achieves Fourier space extension by structuring illumination in the real space, we show that effective detector area of an imaging system can be extended by structuring in the Fourier space. Structuring in Fourier space is achieved by a designer phase mask in the Fourier plane of the imaging system and the extended FOV can be obtained in single shot image record. A PSF design for extended FOV and corresponding experimental results will be described.