We present our latest results on a structured illumination microscope (SIM) implementation using individual microelectromechanical systems (MEMS) micromirrors with three-axis full angular, radial and phase control of the illumination pattern in the sample. Results of a simultaneous multi-color 2D SIM and 3D SIM implementation are shown with digital system adjustment to select the optimal imaging conditions and adapt to variable microscope objectives used in the system. Calibration and cell images of 2D and 3D samples will be shown to verify the resolution enhancement and axial sectioning potential.
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Tinning et al. (2024) studied this question.
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