Resolving individual carrier dynamics with kHz single-shot optical-pump terahertz-probe spectroscopy in high magnetic fields

We introduce a novel method of isolating carrier dynamics in optically excited semiconductors using optical-pump terahertz-probe spectroscopy, with a large external magnetic field to isolate different carrier types based on their cyclotron energies. We employ new echelon-based single-shot detection that utilizes a pair of 1D line array detectors which can read out at a 1 kHz repetition rate, reducing acquisition time by more than an order of magnitude. This enables collection of full 2D optical-pump/THz-probe scans at different magnetic fields. We demonstrate these capabilities by performing cyclotron resonance measurements in bulk silicon, and discover distinct carrier dynamics for electrons and holes, as well as their dependence on an external magnetic field.