A new imaging method based on terahertz detection platform

Because of terahertz waves high frequency, low photon energy and high non-polar penetration, terahertz waves have become the focus of worldwide attention and research in recent years. Terahertz wave imaging technology has become an important aspect of the research of terahertz wave technology because of its special uses and advantages compared with x-ray, ultrasonic and infrared imaging methods. This paper studies the terahertz detection platform which can be used for non-destructive testing. Based on the analysis of different types of terahertz imaging technology in different application fields, the basic idea of using frequency-modulated continuous terahertz wave source to carry out reflective three-dimensional point-by-point scanning imaging of objects is determined by combining the characteristics of imaging samples and the requirements of system imaging indicators. Through the detection platform to detect the defects of samples with different refractive indices, and through the new quantum image algorithm to achieve image reconstruction, the corresponding defects of the samples can be clearly seen from the results, and the resolution can be further improved, laying the foundation for filling the vacancy in the field of nondestructive testing.