A Simple Spectral Method for Nanoplastic Identification and Characterisation

Abstract Detecting and monitoring the presence of nanoplastics (NPs) in the environment is a challenge due to their small size compared to the diffraction limits (~ 300 nm) of conventional spectroscopy. To address this, we developed a straightforward fluorescence mapping technology capable of accurately locating, quantifying, and identifying Nile-Red-stained polystyrene and polyethylene terephthalate NPs down to sizes of 60 nm. Verification of the quantity and locations of dyed NPs within a scanned area was carried out by scanning electron microscopy in conjunction with fluorescence mapping analysis. The ability to successfully resolve individual NPs of different type and sizes in complex real-world samples in the presence of contaminant and chemical additive nanoparticles was demonstrated and provides the basis for low-cost rapid screening of NPs.