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February 25, 2024Machine Learning with ApplicationsOpen Access

Efficient machine learning-assisted failure analysis method for circuit-level defect prediction

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JGJoydeep Ghosh

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Joydeep Ghosh (2024) studied this question.

synapsesocial.com/papers/68e77b26b6db6435876ef3bfhttps://doi.org/10.1016/j.mlwa.2024.100537
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