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Variable sampling plans incorporating process capability indices (PCIs) have been introduced to adapt to the changing landscape of modern manufacturing, where the occurrence of defective goods has significantly decreased. Skip-lot sampling plans (SkSP) are particularly effective for batches characterized by consistent and high product quality. Additionally, manufacturers with a strong track record of producing high-quality goods or possessing empirical knowledge about their production processes can benefit from resampling. It has been demonstrated that resubmitted sampling plans outperform traditional single sampling plans. In this study, a novel variant of skip-lot sampling, referred to as SkSP-SR, is proposed. SkSP-SR utilizes two reference plans: one for normal inspection (utilizing SSP) and the other for skip inspection (utilizing RSP). The approach also considers the loss of information associated with deviations from the target by incorporating the Taguchi capability index. Compared to traditional sampling plans, the suggested approach not only reduces sample sizes but also enhances discriminating power. Comprehensive tables presenting plan parameters for commonly used quality and risk criteria are provided, enabling practitioners to readily implement the recommended plan.
Nabil El Farme (Thu,) studied this question.