In-Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique

This work explores a combination of techniques using pulsed and continuous lasers to investigate and quantify the suit-ability of state-of-the-art logic technology for radiation hardened applications. We find that using a laser allows the sensitivity of underlying circuitry to be evaluated providing insights into the underlying failure mechanisms and enabling further hardening by design opportunities. Lastly, we show a non-invasive pump-probe laser voltage probe technique that allows us to evaluate logic circuitry response of various design topologies to ionizing radiation events.