Ultrafast dynamics of carriers, coherent acoustic phonons and strain pulses in BiSbTe1.5Se1.5 topological insulator thin films

We Investigate the ultrafast carrier, coherent acoustic phonons (CAPs), and acoustic strain pulse dynamics in topological insulator BiSbTe1.5Se1.5 (BSTS) thin films of varying thickness using degenerate pump-probe reflection spectroscopy. Here, Sapphire has been chosen as the main substrate due to its maximum acoustic reflectivity at the BSTS-sapphire interface compared to BSTS-GaAs, BSTS-Si, and BSTS-MgO interfaces. For the films with thickness more than twice the penetration depth, the transient reflectivity data predominantly exhibits travelling acoustic strain pulses (TASP) on the top of single-exponential electronic decay (~ 2 ps). In contrast, films with thickness less than penetration depth are dominated by CAPs and a bi exponential electronic background with decay times of ~ 2 ps and ~ 260-380 ps. The observed TASP dynamics are well-described by a theoretical acoustic strain model. Further, to elucidate the underlying physical mechanisms governing the behavior of photo-excited carriers, CAPs, and strain pulses, we performed carrier density and temperature-dependent (7-294 K) studies on BSTS films with thicknesses of 22 nm and 192 nm. In the 22 nm film, the both fast and slow decay processes increase with carrier density at room temperature but decrease with temperature at a carrier density of 1.7*10¹⁹ cm⁻³. A detailed analysis suggests that the faster decay arises from electron-phonon scattering and carrier diffusion, while the slower decay likely results from defect-assisted and phonon-assisted recombination. Furthermore, increasing the sample temperature leads to anharmonic decay induced softening of ~ 14 % in the phonon frequency and an anomalous ~ 48 % decrease in the phonon damping parameter due to reduced Dirac surface electron and acoustic phonon scattering.