Electrical measurements reveal distinct Schottky barriers in n-type hex-SiGe, suggesting its potential for optoelectronic use.
We report electrical measurements on hexagonal silicon-germanium (hex-SiGe), a group IV alloy with direct bandgap. Electrical contacts are formed by metal alloying and doping is achieved using ion implantation. The metastable hex-SiGe phase is successfully recovered after implantation by solid phase recrystallization. Independent of the metal used, contacts on n-type resulted in Schottky barriers due to Fermi level pinning of hex-SiGe. Overall, this constitutes a first step towards use of hex-SiGe for optoelectronic applications.
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Bollier et al. (2025) studied this question.
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