This study demonstrates improved accuracy in planar capacitors by modeling ohmic losses and parasitic inductance in substrates.
The study and modelling of planar capacitors remain highly relevant due to their broad applications. However, their accurate modelling presents significant challenges due to intrinsic high-frequency effects, which include not only parasitic inductance but also ohmic losses in the copper and dielectric losses in the substrate. Therefore, this work proposes developing a new simplified planar capacitor model consisting of two identical rectangular plates, which incorporates the effects of both the substrate and the medium between the conductor traces on the total capacitance. Moreover, it includes the impact of parasitic inductance and losses associated with the copper and substrate. This study demonstrated the importance of modelling both the dielectric substrate and the inter-conductor medium, with results showing significant improvements in the proposed model's accuracy. Experimental validation through comparison with an already established model in the literature and physical planar capacitors revealed good agreement for most cases studied.
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Lima et al. (2025) studied this question.
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