Intelligent Solutions to Processor Error Rates: AI-Driven Diagnostics and Parallel Architecture Design

The study focuses on the high error rates in modern electronic devices due to algorithmic issues, interference, and structural defects. It uses questionnaires, interviews, and data analysis to investigate causes and strategies for mitigating processor failures. Key discoveries include artificial intelligence for error correction, multi-core processing methods, and improved calculations. The report recommends developing accurate testing programs, improving collaboration, improving algorithms, and designing parallel processors.