Automated system measures δ 30 Si with accuracy better than 0.05 ‰ using thermal decomposition, indicating high reliability in diverse samples.
The Nu Sil inlet system and Nu Perspective IRMS measure δ 30 Si with better than 0.05 ‰ accuracy through the thermal decomposition of barium fluosilicate. Sample preparation accommodates diverse materials with negligible sample matrix effects.
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Brzezinski et al. (2025) studied this question.
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