The study reveals enhanced imaging technology in optoelectronic systems, suggesting improvements in integration and resolution.
This study introduces a novel imaging technology designed to address the critical challenges of high integration, wide field of view (FOV), and high-resolution detection in optoelectronic systems. The proposed approach leverages ultra-small pixels and a unique “single-eye + compound-eye” architecture, combining a concentric spherical lens for wide-FOV light collection with a distributed camera array for segmented imaging and stitching of the Petzval image plane. This design enables high-resolution imaging across a large area while maintaining compact system dimensions. The ultra-small-pixel large-format detector excels in capturing fine details, and by applying linear system theory, the technology achieves significant reductions in system size and complexity without compromising performance. Experimental validation shows that the imaging system achieves a modulation transfer function near the diffraction limit at 500 lp/mm, with a root-mean-square spot size consistently below 1 μm. Additionally, the system delivers an angular resolution of 25 μrad and distortion-free imaging over a 61.5∘×55∘ FOV.
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Zhang et al. (2025) studied this question.
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