Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 11, 2025ChipsOpen Access

Exploring Accelerated Aging Stress for Physical Unclonable Function Self-Corruption

View Full Paper
Ask AI
Bookmark
Share

Authors

EHEric Hunt-SchroederTXTian Xia

Discussion

Loading...

Member takes

Overview

Exploration reveals a self-corrupting Physical Unclonable Function against unauthorized access in recycled electronics, highlighting the role of accelerated aging.

Key Points

  • Corruption of the encryption key invalidates the Physical Unclonable Function, blocking future authentication attempts.
  • About 30% of PUF entropy is corrupted, tripling prior data corruption techniques using accelerated aging methods.
  • Assessment using accelerated aging techniques, notably through electomigration processes to enhance security against invasive attacks.
  • The technique shows potential for improved anti-counterfeit measures in End of Life electronic recycling.

Cite This Study

Hunt-Schroeder et al. (2025) studied this question.

synapsesocial.com/papers/69252e96c0ce034ddc356260https://doi.org/10.3390/chips4040048
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 116.3 3nm Physical Unclonable Function with Multi-Mode Self-Destruction and 3.48×10<sup>-5</sup> Bit Error Rate2024
  2. 2Ultradurable Embedded Physically Unclonable Functions2024 · 10 citations
  3. 3Tamper‐Responsive Physical Unclonable Functions via Graphene‐Interlayered Block Copolymer Random Structures2026
  4. 4DCDC PUF an enhanced implementation of ring oscillator based PUF2025
  5. 5Unveiling the Vulnerability of Oxide-Breakdown-Based PUF2024 · 6 citations