Accelerated test reveals high overpotential drives Si deposition at Ni/YSZ electrodes, suggesting degradation mechanisms.
An accelerated test using a contaminated layer reveals how Si impurities accumulate at the Ni/YSZ electrode. High local overpotential and steam partial pressure are shown to drive the deposition of SiO 2 at the TPBs and its subsequent electrochemical reduction into Ni particles.
No takes yet. Share an insight, caveat, or question.
Li et al. (2025) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: