Optimal truncated repetitive sampling inspection plans under time-censoring based on type-I half-logistic Nadarajah-Haghighi distribution

Truncated repetitive acceptance sampling plans ( TRASP s) are introduced in reliability testing to design optimal time-censored inspection schemes with controlled producer’s and consumer’s risks. The device lifetime follows the type I half-logistic Nadarajah-Haghighi ( TIHLNH ) distribution. In terms of average sample number ( ASN ), optimal TRASP s outperform both standard repetitive and single sampling plans. Integer nonlinear programming problems are solved to find ASN -optimal and minimax- ASN reliability test plans. Two practical applications are included for illustrative purposes. The results derived for TIHLNH distributions are also valid for any other lifetime model.