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December 5, 2025Applied SciencesOpen Access

Optical Studies of Al2O3:ZnO and Al2O3:TiO2 Bilayer Films in UV-VIS-NIR Spectral Range

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Authors

MSMagdalena M. SzindlerMSM. SzindlerKTKatarzyna Tokarczyk

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Overview

Ellipsometric analysis demonstrates improved optical properties in bilayer films based on atomic layer deposition techniques.

Key Points

  • Optical properties improved in bilayer films with varying thickness of thin layers, enhancing performance.
  • Spectrophotometric analysis confirmed consistency with theoretical models across a vast spectral range of 200 to 2500 nm.
  • Investigation utilized atomic layer deposition, a method for precise layer creation on silicon substrates, among other techniques.
  • Findings indicate significant enhancements in antireflective properties while maintaining minimal extinction coefficients.

Cite This Study

Szindler et al. (2025) studied this question.

synapsesocial.com/papers/694022532d562116f28fc3afhttps://doi.org/10.3390/app152412870
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