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February 6, 2026Small

Beyond Imaging: Atomic Force Microscopy as an Integrated Tool for Nanomechanical Probing and Active Manipulation of Low‐Dimensional Materials

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Authors

KJKe JiangWuhan University of Science and TechnologyBDBo DuanWuhan University of Technology

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Implication

This review demonstrates the use of AFM to measure mechanical properties in low-dimensional materials, suggesting a pathway for advanced material design.

Key Points

  • The aim is to summarize the capabilities of atomic force microscopy in characterizing and manipulating low-dimensional materials.
  • Review of AFM-based techniques for measuring nanomechanical properties.
  • Analysis of fundamental mechanical properties including elastic modulus and adhesion.
  • Assessment of dynamic behaviors like friction and fatigue.
  • Discussion of nanomanipulation capabilities such as picking and folding materials.
  • AFM shows exceptional sensitivity and resolution for nanomechanical measurements.
  • Techniques provide insights into fundamental mechanical behaviors and enable precise manipulation.
  • Integration of diverse AFM methods enhances understanding of material properties at the nanoscale.

Cite This Study

Jiang et al. (2026) studied this question.

synapsesocial.com/papers/698586ad8f7c464f2300a6e7https://doi.org/10.1002/smll.202513175
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