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The research aims to evaluate improvements in longitudinal electron beam diagnostics following the FLASH2020+ upgrade.

February 19, 2026Open Access

Recent Upgrades Of Longitudinal Diagnostics At FLASH

Key Points

The research aims to evaluate improvements in longitudinal electron beam diagnostics following the FLASH2020+ upgrade.
Modernized electro-optical bunch length detector (EOD) added
Implemented bunch compression monitor (BCM)
Introduced bunch arrival-time monitor (BAM)
Upgraded control interface for THz intensity spectrometer (CRISP)
Conducted overview and re-commissioning of diagnostic systems
Enhanced measurement capabilities for bunch profiles
Increased accessibility for non-experts to perform diagnostics
Established a more comprehensive set of tools for longitudinal diagnostics
Improved status of longitudinal electron beam diagnostics at FLASH

Abstract

In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD), as well as an additional bunch compression monitor (BCM) and a bunch arrival-time monitor BAM) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP) received a modernized control interface that will allow non-experts to perform bunch profile measurements.The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.

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Czwalinna et al. (Wed,) studied this question.

synapsesocial.com/papers/6996a8a9ecb39a600b3ef98c https://doi.org/https://doi.org/10.3204/pubdb-2025-03888

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