Experimental station demonstrates synchrotron radiation applications in X-ray fluorescence microanalysis, indicating new techniques.
The use of storage rings as dedicated sources of synchrotron radiation together with the new developments of insertion devices have allowed, in recent years, the application of synchrotron radiation to the conventional methods of X-ray fluorescence (XRF). In addition, the so-called XRF induced by synchrotron radiation has given rise to the development of new spectrochemical techniques[1]. An experimental station for X-ray fluorescence studies has been installed at the PWA laboratory of the LNF. This station is mainly oriented to microanalysis, but it is possible to perform other techniques. The apparatus existing at the beginning of 1991 consisted of an experimental chamber allowing conventional KRF (SRXRF) and total reflection X-ray fluorescence (TRXRF), but the latter was never implemented. The conventional system consists of a sample holder (3x6 cm) that can be positioned along the X,Y axis with a precision of μ m. The geometry of measurement is 90 degrees with 45 degrees of incident and take-off directions. At the entrance of the chamber two slits allow an orthogonal collimation. The detecting system consists of a solid-state detector with a Si(Li) crystal (Silena), a high voltage source (ORTEC 478), an amplifier (ortec 572), and a multichannel analyzer (ORTEC 916).
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E et al. (1991) studied this question.
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